Department / Course College of Information Science and Engineering Department of Information Science and Engineering
Title / Position Professor
Date 2010/11
Presentation Theme Sequential Importance Sampling for Low-Probability and High-Dimensional SRAM Yield Analysis
Conference Proc. IEEE/ACM 2010 Intl. Conference on Computer-Aided Design (ICCAD 2010)
Conference Type International
Presentation Type Speech (General)
Contribution Type Collaborative
Publisher and common publisher Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato