Department / Course College of Information Science and Engineering Department of Information Science and Engineering
Title / Position Professor
Date 2017/03/02
Presentation Theme Reliability enhancement of hierarchical data reading circuit of wafer scale mask ROM
Conference Technical Report of IEICE, vol. 116, no. 478, pp. 49-54
Promoters IEICE Technical Committee on VLSI Design Technologies
Location Okinawaken Seinenkaikan
Conference Type Domestic
Presentation Type Speech (General)
Contribution Type Collaborative
Publisher and common publisher Takaaki Yokoyama, Hiroyuki Ochi