Department / Course College of Information Science and Engineering Department of Information Science and Engineering
Title / Position Professor
Date 2013/03/20
Presentation Theme Hot-swapping architecture with back-biased testing for mitigation of permanent faults in functional unit array
Conference Design, Automation & Test in Europe (DATE)
Location Grenoble, France
Conference Type International
Presentation Type Speech (General)
Contribution Type Collaborative
Publisher and common publisher Zoltan Endre Rakosi, Masayuki Hiromoto, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, and Hiroyuki Ochi