Department / Course College of Information Science and Engineering Department of Information Science and Engineering
Title / Position Professor
Date 2011/06
Presentation Theme A Stress- Parallelized Device Array for Efficient Bias-Temperature Stability Measurement
Conference Proc. IEEE Intl. Workshop on Design for Manufacturability and Yield (DFM&Y)
Conference Type International
Presentation Type Speech (General)
Contribution Type Collaborative
Publisher and common publisher Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, Hiroyuki Ochi